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authorRyota Sakamoto <sakamo.ryota@gmail.com>2026-01-23 00:40:41 +0900
committerYury Norov <ynorov@nvidia.com>2026-02-08 18:47:29 -0500
commit6711069dd72fcbafe010fb16be504364e5ced190 (patch)
tree1155f3b32f1e0352e9b1c784f14721eaa8636f74 /lib/tests
parent9d6f6764939f9594d2de24ab3b2701d6ee592c0a (diff)
lib/tests: extend KUnit test for bitops with more cases
Extend a KUnit test suite for the bitops API to cover more APIs from include/asm-generic/bitops/instrumented-atomic.h. - change_bit() - test_and_set_bit() - test_and_clear_bit() - test_and_change_bit() Verified on x86_64, i386, and arm64 architectures. Sample KUnit output: KTAP version 1 # Subtest: test_change_bit ok 1 BITOPS_4 ok 2 BITOPS_7 ok 3 BITOPS_11 ok 4 BITOPS_31 ok 5 BITOPS_88 # test_change_bit: pass:5 fail:0 skip:0 total:5 ok 2 test_change_bit KTAP version 1 # Subtest: test_test_and_set_bit_test_and_clear_bit ok 1 BITOPS_4 ok 2 BITOPS_7 ok 3 BITOPS_11 ok 4 BITOPS_31 ok 5 BITOPS_88 # test_test_and_set_bit_test_and_clear_bit: pass:5 fail:0 skip:0 total:5 ok 3 test_test_and_set_bit_test_and_clear_bit KTAP version 1 # Subtest: test_test_and_change_bit ok 1 BITOPS_4 ok 2 BITOPS_7 ok 3 BITOPS_11 ok 4 BITOPS_31 ok 5 BITOPS_88 # test_test_and_change_bit: pass:5 fail:0 skip:0 total:5 ok 4 test_test_and_change_bit Signed-off-by: Ryota Sakamoto <sakamo.ryota@gmail.com> Signed-off-by: Yury Norov <ynorov@nvidia.com>
Diffstat (limited to 'lib/tests')
-rw-r--r--lib/tests/bitops_kunit.c63
1 files changed, 63 insertions, 0 deletions
diff --git a/lib/tests/bitops_kunit.c b/lib/tests/bitops_kunit.c
index 5c47a1276061..7fd9d697f131 100644
--- a/lib/tests/bitops_kunit.c
+++ b/lib/tests/bitops_kunit.c
@@ -66,6 +66,66 @@ static void test_set_bit_clear_bit(struct kunit *test)
KUNIT_EXPECT_EQ(test, bit_set, BITOPS_LENGTH);
}
+static void test_change_bit(struct kunit *test)
+{
+ const struct bitops_test_case *params = test->param_value;
+ DECLARE_BITMAP(bitmap, BITOPS_LENGTH);
+ int bit_set;
+
+ bitmap_zero(bitmap, BITOPS_LENGTH);
+
+ change_bit(params->nr, bitmap);
+ KUNIT_EXPECT_TRUE(test, test_bit(params->nr, bitmap));
+
+ change_bit(params->nr, bitmap);
+ KUNIT_EXPECT_FALSE(test, test_bit(params->nr, bitmap));
+
+ bit_set = find_first_bit(bitmap, BITOPS_LENGTH);
+ KUNIT_EXPECT_EQ(test, bit_set, BITOPS_LENGTH);
+}
+
+static void test_test_and_set_bit_test_and_clear_bit(struct kunit *test)
+{
+ const struct bitops_test_case *params = test->param_value;
+ DECLARE_BITMAP(bitmap, BITOPS_LENGTH);
+ int bit_set;
+
+ bitmap_zero(bitmap, BITOPS_LENGTH);
+
+ KUNIT_EXPECT_FALSE(test, test_and_set_bit(params->nr, bitmap));
+ KUNIT_EXPECT_TRUE(test, test_bit(params->nr, bitmap));
+
+ KUNIT_EXPECT_TRUE(test, test_and_set_bit(params->nr, bitmap));
+ KUNIT_EXPECT_TRUE(test, test_bit(params->nr, bitmap));
+
+ KUNIT_EXPECT_TRUE(test, test_and_clear_bit(params->nr, bitmap));
+ KUNIT_EXPECT_FALSE(test, test_bit(params->nr, bitmap));
+
+ KUNIT_EXPECT_FALSE(test, test_and_clear_bit(params->nr, bitmap));
+ KUNIT_EXPECT_FALSE(test, test_bit(params->nr, bitmap));
+
+ bit_set = find_first_bit(bitmap, BITOPS_LENGTH);
+ KUNIT_EXPECT_EQ(test, bit_set, BITOPS_LENGTH);
+}
+
+static void test_test_and_change_bit(struct kunit *test)
+{
+ const struct bitops_test_case *params = test->param_value;
+ DECLARE_BITMAP(bitmap, BITOPS_LENGTH);
+ int bit_set;
+
+ bitmap_zero(bitmap, BITOPS_LENGTH);
+
+ KUNIT_EXPECT_FALSE(test, test_and_change_bit(params->nr, bitmap));
+ KUNIT_EXPECT_TRUE(test, test_bit(params->nr, bitmap));
+
+ KUNIT_EXPECT_TRUE(test, test_and_change_bit(params->nr, bitmap));
+ KUNIT_EXPECT_FALSE(test, test_bit(params->nr, bitmap));
+
+ bit_set = find_first_bit(bitmap, BITOPS_LENGTH);
+ KUNIT_EXPECT_EQ(test, bit_set, BITOPS_LENGTH);
+}
+
struct order_test_case {
const char *str;
const unsigned int count;
@@ -121,6 +181,9 @@ static void test_get_count_order_long(struct kunit *test)
static struct kunit_case bitops_test_cases[] = {
KUNIT_CASE_PARAM(test_set_bit_clear_bit, bitops_gen_params),
+ KUNIT_CASE_PARAM(test_change_bit, bitops_gen_params),
+ KUNIT_CASE_PARAM(test_test_and_set_bit_test_and_clear_bit, bitops_gen_params),
+ KUNIT_CASE_PARAM(test_test_and_change_bit, bitops_gen_params),
KUNIT_CASE_PARAM(test_get_count_order, order_gen_params),
#ifdef CONFIG_64BIT
KUNIT_CASE_PARAM(test_get_count_order_long, order_long_gen_params),